发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor device by which the resistance value of a metallic thin film resistor can be stabilized by etching an insulating film by using the Ar sputter etching technique before a metallic thin film used for forming the metallic thin film resistor is formed on the insulating film. SOLUTION: After connection holes 21 are formed in a second interlayer insulating film 19, the Ar sputter etching is performed on the surface of the insulating film 19 including the inside of the connection holes 21. Successively, a CrSi thin film (metallic thin film) 37 for metallic thin film resistor is formed continuously without breaking the vacuum after the Ar sputter etching is completed. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005268746(A) 申请公布日期 2005.09.29
申请号 JP20040291419 申请日期 2004.10.04
申请人 RICOH CO LTD 发明人 YAMASHITA KIMIHIKO;HASHIMOTO TAISUKE
分类号 H01L21/3205;H01L21/822;H01L23/52;H01L27/04;(IPC1-7):H01L21/822;H01L21/320 主分类号 H01L21/3205
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