摘要 |
An improved p-type gallium nitride-based semiconductor device is disclosed. The device includes a structure with at least one p-type Group III nitride layer that includes some gallium, a first silicon dioxide layer on the p-type layer, a layer of a Group II metal source composition on the first SiO<SUB>2</SUB>layer, and a second SiO<SUB>2 </SUB>layer on the Group II metal source composition layer.
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