发明名称 SAMPLE HOLDING DEVICE AND X-RAY DIFFRACTION APPARATUS USING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a sample holding device capable of coping with both X-ray diffraction measurements of a transmission method or a reflection method, holding a plurality of samples, and arranging an optional portion of each held sample on an X-ray irradiation position. SOLUTION: This sample holding device is equipped with a transmission type sample holder support member 42 capable of mounting detachably a transmission type sample holder 40 adaptable to the X-ray diffraction measurement by the transmission method, and a reflection type sample holder support member capable of mounting detachably a reflection type sample holder adaptable to the X-ray diffraction measurement by the reflection method. Each sample holder support member can mount a plurality of samples in the longitudinal direction and can mount the sample selectively on a support base 20. A driving motor for moving the mounted sample holder support member is loaded on the support base 20. The optional portion of the sample held by the transmission type sample holder or the reflection type sample holder can be arranged on the X-ray irradiation position of the X-ray diffraction apparatus by a driving force of the driving motor. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005265566(A) 申请公布日期 2005.09.29
申请号 JP20040077436 申请日期 2004.03.18
申请人 RIGAKU CORP 发明人 DOSHIYOU AKIHIDE;KUDO MASATAKA;KAZAMA MAMORU;YAMADA TATSUO;ONO YASUYUKI;OMIYA SADAO;INAGO YOSHIO
分类号 G01N23/207;(IPC1-7):G01N23/207 主分类号 G01N23/207
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