发明名称 Circuit and method for preventing nonvolatile memory from over-erase
摘要 A method for preventing the over-erase in a nonvolatile memory comprises the following steps. First, at least one normal cell of the nonvolatile memory and at least one reference cell that corresponds to the at least one normal cell are provided with a constant current. Second, the erasing threshold voltage of the at least one normal cell is determined, and then the at least one normal cell is erased to be of the erasing threshold voltage. By virtue of adding the constant current, the higher erasing threshold voltage can be acquired, and in consequence over-erase can be avoided.
申请公布号 US2005216652(A1) 申请公布日期 2005.09.29
申请号 US20040940987 申请日期 2004.09.14
申请人 ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. 发明人 CHEN CHUNG ZEN
分类号 G06F12/16;(IPC1-7):G06F12/16 主分类号 G06F12/16
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