| 摘要 |
PROBLEM TO BE SOLVED: To prevent wiring congestion around an external terminal caused by the insertion of an isolation circuit or the like in the test designing of a semiconductor integrated circuit device having a recovery memory capable of making redundancy recovery. SOLUTION: A recovery memory 111 comprises a semiconductor memory 101, a normal memory input pin 151, a test input area pad 121 arranged physically near the semiconductor memory 101, a test input selector 131 for selecting a signal from the normal memory input pin 151 and the test input area pad 121 and supplying it to the semiconductor memory 101, a normal memory output pin 181 to which the output of the semiconductor memory 101 is connected, and a test output area pad 122 to which the output of the semiconductor memory 101 is connected. The arrangement of the test input area pad enables the test implementation of the recovery memory without inserting any isolation circuit to reduce wiring congestion. COPYRIGHT: (C)2005,JPO&NCIPI
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