发明名称 |
Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
摘要 |
A method and an apparatus for testing the function of a plurality of microstructural elements by irradiation with particle radiation. All of the microstructural elements detected as malfunctioning are listed in a first error list in a first test sequence. The microstructural elements listed in the first error list are tested once more in at least one further test sequence and at least the result of the test sequence last carried out is evaluated to establish the overall test result. The first test sequence is designed so that, if possible, all of the microstructural elements which are actually malfunctioning are detected. The invention further relates to a method for producing microstructural elements which are constructed as a plurality on a substrate and are tested according to the above test method.
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申请公布号 |
US2005212545(A1) |
申请公布日期 |
2005.09.29 |
申请号 |
US20020115685 |
申请日期 |
2002.04.04 |
申请人 |
BRUNNER MATTHIAS;SCHMID RALF |
发明人 |
BRUNNER MATTHIAS;SCHMID RALF |
分类号 |
G01R31/302;G01N23/225;G01R1/06;G01R31/26;G01R31/307;G01R31/311;G02F1/13;H01L21/66;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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