Testing apparatus for a sequence of transistors and the like having a condition responsive marker,申请号US19630284883-传众专利搜索

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发明名称	Testing apparatus for a sequence of transistors and the like having a condition responsive marker
摘要
申请公布号	US3344351(A)	申请公布日期	1967.09.26
申请号	US19630284883	申请日期	1963.06.03
申请人	GENERAL INSTRUMENT CORPORATION	发明人	SIMONYAN KARABET;KIM HANJOO
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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