发明名称 Semiconductor device having electrostatic destruction protection circuit using thyristor as protection element
摘要 A semiconductor device includes a thyristor, trigger circuit and surge detection/leakage reduction circuit. The anode of the thyristor is connected to a first terminal and the cathode thereof is connected to a second terminal. The trigger circuit is configured to fire the thyristor when surge voltage is applied to the first terminal. The surge detection/leakage reduction circuit is provided between the gate of the thyristor and the second terminal and configured to interrupt current flowing from the trigger circuit to the second terminal in the normal operation mode and set trigger voltage which is used to fire the thyristor in cooperation with the trigger circuit at the surge voltage application time.
申请公布号 US2005212009(A1) 申请公布日期 2005.09.29
申请号 US20040958319 申请日期 2004.10.04
申请人 SATO KOICHI 发明人 SATO KOICHI
分类号 H01L27/04;H01L21/822;H01L23/60;H01L23/62;H01L27/02;H01L29/74;(IPC1-7):H01L29/74 主分类号 H01L27/04
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