发明名称 Method to prevent bit line capacitive coupling
摘要 Structures, systems and methods for memory cells utilizing trench bit lines formed within a buried layer are provided. A memory cell is formed in a triple well structure that includes a substrate, the buried layer, and an epitaxial layer. The substrate, buried layer, and epitaxial layer include voltage contacts that allow for the wells to be biased to a dc voltage level. The memory cell includes a transistor which is formed on the epitaxial layer, the transistor including a source and drain region separated by a channel region. The trench bit line is formed within the buried layer, and is coupled to the drain region of the transistor by a bit contact.
申请公布号 US2005213410(A1) 申请公布日期 2005.09.29
申请号 US20050131081 申请日期 2005.05.17
申请人 MICRON TECHNOLOGY, INC. 发明人 TRAN LUAN C.
分类号 G11C5/06;G11C7/18;G11C11/4097;H01L21/8242;(IPC1-7):G11C7/00 主分类号 G11C5/06
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