| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit of a semiconductor memory which makes the delivery test of a target device using a few input/output terminals by mounting a serial interface such as JTAG on the semiconductor memory. SOLUTION: The memory circuit of the semiconductor memory performs delivery test items of a wafer other than an input/output pin leakage test using a few input/output terminals (a power supply terminal, GND (grounding) terminal and other five pins) by mounting the serial interface (14) on the semiconductor memory (10). The memory circuit of the semiconductor memory is used as a method to make the delivery test. COPYRIGHT: (C)2005,JPO&NCIPI
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