发明名称 Writing to ferroelectric memory devices
摘要 A programming voltage is applied to a first word line coupled to a control gate of a selected ferroelectric memory cell in an array of ferroelectric memory cells. A gate/source voltage equal to the programming voltage is sufficient to reverse polarity of each memory cell. A ground potential is applied to a first program line coupled to a first source/drain region of the selected memory cell and to a first bit line coupled to a second source/drain region of the selected memory cell. A fraction of the programming voltage is applied to other word lines coupled to control gates of non-selected memory cells not associated with the first word line, other program lines coupled to first source/drain regions of non-selected memory cells not associated with the first program line, and other bit lines coupled to second source/drain regions of non-selected memory cells not associated with the first bit line.
申请公布号 US2005213365(A1) 申请公布日期 2005.09.29
申请号 US20050130663 申请日期 2005.05.17
申请人 MICRON TECHNOLOGY, INC. 发明人 SALLING CRAIG T.
分类号 G11C11/22;H01L27/115;H01L27/12;(IPC1-7):G11C11/22 主分类号 G11C11/22
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