发明名称 Semiconductor device fabrication method
摘要 The method for fabricating a semiconductor device comprises the step of planarizing the surface of a film-to-be-polished formed over a semiconductor substrate by polishing, with a polishing pad 104 formed of a foam with a plurality of cells 107 incorporated in a base material 105 thereof, the surface being polished with the base material alone while a polishing slurry containing abrasive grains and an additive of a surfactant is being supplied. The film-to-be-polished is polished with the polishing pad of a foam having no shells around the cells, whereby even when a polishing slurry containing the additive of a surfactant is used, the generation of scratches in the surface of the film-to-be-polished can be depressed.
申请公布号 US2005215180(A1) 申请公布日期 2005.09.29
申请号 US20040918443 申请日期 2004.08.16
申请人 FUJITSU LIMITED 发明人 IDANI NAOKI
分类号 B24B37/00;B24B1/00;B24B37/04;B24B37/20;B24B37/22;B24B37/24;H01L21/304;H01L21/3105;(IPC1-7):B24B1/00 主分类号 B24B37/00
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