发明名称 FUSE RIGION OF SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>In a fuse region of a semiconductor device, and a method of fabricating the same, the fuse region includes an interlayer insulating layer on a semiconductor substrate, a plurality of fuses on the interlayer insulating layer disposed in parallel with each other, a blocking layer on the interlayer insulating layer between each of the plurality of fuses and in parallel with the plurality of fuses, and a plurality of fuse grooves recessed into the interlayer insulating layer between each of the plurality of fuses and the blocking layer.</p>
申请公布号 KR20050095260(A) 申请公布日期 2005.09.29
申请号 KR20040020520 申请日期 2004.03.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, HYUCK JIN;HYUN, CHANG SUK;MOON, IL YOUNG;LEE, KANG YOON;SIM, KWANG BO;JEON, SANG KIL
分类号 H01L21/82;H01L23/525;H01L29/00;(IPC1-7):H01L21/82 主分类号 H01L21/82
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