发明名称 |
SEMICONDUCTOR PROCESS AND YIELD ANALYSIS INTEGRATED REAL-TIME MANAGEMENT METHOD |
摘要 |
<p>A semiconductor process and yield analysis integrated real-time management method comprises inspecting a plurality of semiconductor products with a plurality of items to generate and record a plurality of inspecting results during semiconductor process, classifying the semiconductor products as a plurality of groups with a default rule to generate and record an initial data in a database, indexing a plurality of semiconductor product groups and the corresponding initial data from the database by a default product rule and parameter to calculate a corresponding analysis result, and displaying the analysis result according to the indexed semiconductor product groups and the initial data.</p> |
申请公布号 |
SG114700(A1) |
申请公布日期 |
2005.09.28 |
申请号 |
SG20050000640 |
申请日期 |
2005.02.02 |
申请人 |
POWERCHIP SEMICONDUCTOR CORP. |
发明人 |
TAI HUNG-EN;CHEN CHIEN-CHUNG;WANG SHENG-JEN |
分类号 |
G05B19/418;G05B23/02;H01L21/02 |
主分类号 |
G05B19/418 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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