发明名称 Method and apparatus for providing a preselected voltage to test or repair a semiconductor device
摘要 A method and apparatus for providing a preselected voltage to test or repair a semiconductor device. The apparatus includes a one-stage pump and a transfer device. The one-stage pump is adapted to access a first voltage and provide a second voltage using the first voltage. The transfer device is capable of providing the first voltage to a node using the second voltage.
申请公布号 US6949953(B2) 申请公布日期 2005.09.27
申请号 US20020166192 申请日期 2002.06.10
申请人 MICRON TECHNOLOGY, INC. 发明人 CIOACA DUMITRU
分类号 G01R31/319;G11C29/56;(IPC1-7):H03K19/094 主分类号 G01R31/319
代理机构 代理人
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