发明名称 METHOD OF FABRICATING A FIN FIELD EFFECT TRANSISTOR USING AN ISOTROPIC ETCHING TECHNIQUE
摘要 <p>Methods of fabricating a fin field effect transistor (FinFET) are disclosed. Embodiments of the invention provide methods of fabricating FinFETs by optimizing a method for forming the fin so that a short channel effect is prevented and high integration is achieved. Accordingly, the fin which has a difficulty in its formation using the current photolithography-etching technique may be readily formed.</p>
申请公布号 KR20050092933(A) 申请公布日期 2005.09.23
申请号 KR20040018122 申请日期 2004.03.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEO, HYEOUNG WON;YANG, WOUN SUCK;SONG, DU HEON;YOUN, JAE MAN
分类号 H01L29/78;H01L21/336;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L29/78
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