| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of testing whiskers in a tinning film where the testing of whiskers is performed for a short period through, regarding the testing of the growing conditions of whiskers for securing the reliability of a tinned electronic component or the like, an extremely long period in the range from a half year to two years (in the case it is long) has been taken heretofore. SOLUTION: Regarding the method of testing whiskers in a tinning film, a tinning film of 3 to 15μm is formed on a copper or copper alloy base material, thereafter, the tinning film is rapidly dipped into an aqueous solution comprising a surfactant, ultrasonic vibration is applied thereto by an ultrasonic washing machine, and subsequently, the tinning film is preserved at 50°C-90% RH for 168 hr. COPYRIGHT: (C)2005,JPO&NCIPI
|
