发明名称 Methods of forming materials within openings, and methods of forming isolation regions
摘要 In one aspect, the invention includes a method of forming a material within an opening, comprising: a) forming an etch-stop layer over a substrate, the etch-stop layer having an opening extending therethrough to expose a portion of the underlying substrate and comprising an upper corner at a periphery of the opening, the upper corner having a corner angle with a first degree of sharpness; b) reducing the sharpness of the corner angle to a second degree; c) after reducing the sharpness, forming a layer of material within the opening and over the etch-stop layer; and d) planarizing the material with a method selective for the material relative to the etch-stop layer to remove the material from over the etch-stop layer while leaving the material within the opening.
申请公布号 US2005208730(A1) 申请公布日期 2005.09.22
申请号 US20050115833 申请日期 2005.04.25
申请人 MOORE JOHN T;BLALOCK GUY T 发明人 MOORE JOHN T.;BLALOCK GUY T.
分类号 H01L21/3105;H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/3105
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