发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reducing the generation of a void in thin width wiring and preventing the disconnection of the wiring, in a wiring structure wherein wirings having different wiring widths are connected to each other in the same wiring layer. SOLUTION: The semiconductor device is equipped with wide wiring 11 formed on a semiconductor substrate so as to have a wide wiring width (a), and the thin wiring 12 formed on the same wiring layer as the wide width wiring 11 so as to have a thin wiring width (b) thinner than 0.2μm. The wide wiring 11 is connected to the thin wiring 12 at the part of wiring width (a) and the part of wiring width (b) while a ratio (a/b) of the wiring width (a) to the other wiring width (b) is set so as to be smaller than 10. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005259968(A) 申请公布日期 2005.09.22
申请号 JP20040069255 申请日期 2004.03.11
申请人 TOSHIBA CORP 发明人 YAMADA MASAKI
分类号 H01L21/3205;H01L21/4763;H01L23/48;H01L23/52;H01L23/528;H01L23/532;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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