发明名称 INFRARED RAY IMAGE CORRECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an infrared ray image correction apparatus detecting a blinking defect with high accuracy without being affected by lens shading correction deviation, offset correction deviation and sensitivity correction deviation. SOLUTION: An infrared ray solid-state imaging element images an object the temperature of which is almost constant for an imaging time by closing or opening a shutter so that the temperature is almost constant for the imaging time, an image memory stores a plurality of frames of outputs from the infrared ray solid-state imaging element, a blinking defect detection means calculates an average and a standard deviation of outputs of the infrared ray solid-state imaging element over a plurality of frames for pixels configuring the infrared ray solid-state imaging element, calculates an absolute value subtracting the average from the output of the infrared ray solid-state imaging element by each frame, and regards a blinking defect to be caused in the pixels wherein the absolute value is greater than a constant number multiple of the standard deviation because of the discrimination that the output variation from the average is considerably greater and the output is momentarily fluctuated. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005260453(A) 申请公布日期 2005.09.22
申请号 JP20040067291 申请日期 2004.03.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 FURUKAWA TSUTOMU
分类号 H04N5/33;H04N5/335;H04N5/361;H04N5/367;H04N5/372;(IPC1-7):H04N5/33 主分类号 H04N5/33
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