TEST DEVICE AND TEST METHOD

摘要

A test device includes: a pattern generator for generating an address signal, a data signal, an expectation signal for supply to a memory under test; a logic comparator for outputting fail data when the output signal outputted from the memory under test does not coincide with the expectation signal; a first FBM for storing fail data in the first test; a second FBM for accumulating and storing the fail data stored in the first FBM and the fail data in a second test; and a remedy analysis unit for referencing the fail data stored in the first FBM and performing a defect remedy analysis of the memory under test. The first FBM accumulates and stores the fail data stored in the second FBM and fail data in a third test. The remedy analysis unit further references the fail data stored in the second FBM and performs a defect remedy analysis of the memory under test.