| 摘要 |
<P>PROBLEM TO BE SOLVED: To facilitate and quicken a test for a macro circuit, related to an electronic circuit system having a logic circuit and a memory circuit as the macro circuit like a system LSI or the like. <P>SOLUTION: An external terminal for inputting a test signal, and DRAM circuits 57-1 to 57-4 are connected in a half ring shape via transmission signal lines 59-62 for test by using an external terminal for inputting the test signal as the top end, and using the test signal input end of the DRAM circuit 57-4 as the rear end, and the test signal is inputted from the the external terminal for inputting the test signal. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
