发明名称 CHARGING METHOD FOR SEMICONDUCTOR CLEANING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a charging method for semiconductor cleaning apparatus in which charging is conducted on the basis of the amount of removal of foreign matters, in the cleaning process wherein influence on the yield is large in the semiconductor device manufacturing process. SOLUTION: Charging is conducted on the basis of a means for removing foreign matters by cleaning the semiconductor devices with a semiconductor cleaning apparatus provided for the rental to customers, a means for generating numerical value in the amount of foreign matter, a means for transferring the apparatus information of the semiconductor cleaning apparatus and numerical value in the amount of foreign matter, and a numerical value in amount of foreign matter transferred. Accordingly, since charging is conducted on the basis of the number of foreign matter removed, the cash flow can be improved both in the device maker and cleaning apparatus maker and thereby stable management can be realized. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005259935(A) 申请公布日期 2005.09.22
申请号 JP20040068588 申请日期 2004.03.11
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MIYATA TAKESHI;AOKI NORISHIGE
分类号 H01L21/304;H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/304
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