发明名称 Positive resist composition for immersion exposure and pattern-forming method using the same
摘要 A positive resist composition for immersion exposure comprises: (A) a resin containing at least one repeating unit having a fluorine atom and increasing a solubility of the resin in an alkali developer by an action of an acid; and (B) a compound capable of generating an acid upon irradiation with one of an actinic ray and radiation.
申请公布号 US2005208419(A1) 申请公布日期 2005.09.22
申请号 US20050077012 申请日期 2005.03.11
申请人 FUJI PHOTO FILM CO., LTD. 发明人 INABE HARUKI;KANNA SHINICHI;KANDA HIROMI
分类号 G03F7/004;G03F7/039;G03F7/20;(IPC1-7):G03C1/492 主分类号 G03F7/004
代理机构 代理人
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