发明名称 PHASE SHIFT MASK AND METHOD FOR MANUFACTURING PHASE SHIFT MASK
摘要 <P>PROBLEM TO BE SOLVED: To improve dimensional difference between line width L<SB>1</SB>of a resist pattern formed as depending on exposure light transmitting through an engraved groove as a phase shifter, and line width L<SB>2</SB>of a resist pattern formed depending on the exposure light transmitting through other transparent region, without inducing collapse or peeling of the light shielding pattern. <P>SOLUTION: The mask comprises: a transparent substrate 1 having two regions transmitting exposure light and having a recessed portion which inverts the phase of the exposure light transmitting one region, the recessed portion formed in the other region; and a light shielding film 2 blocking the exposure light, the film formed in such a manner that the film has a plurality of film thicknesses and that the end of the film does not cover the recessed part. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005257962(A) 申请公布日期 2005.09.22
申请号 JP20040068302 申请日期 2004.03.11
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 WATANABE KUNIO
分类号 G03F1/30;G03F1/58;G03F1/68;G03F7/20;G03F9/00;H01L21/027 主分类号 G03F1/30
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