发明名称 APPARATUS AND METHOD FOR INSPECTING ELECTRO-OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To appropriately inspect the transmitting performance of electro-optical devices at all times regardless of changes in the characteristics of a light source. SOLUTION: The inspection apparatus includes a light source for irradiating light to electro-optical devices (100 and 101); a moving table (41) having calibrating parts (421 and 422) for receiving and transmitting light from the light source for holding the electro-optical devices at locations different from the locations of the presence of the calibrating parts; a moving means for relatively moving the moving table with respect to the light source in such a way as to selectively irradiate light from the light source to either the calibrating parts or the electro-optical devices; and a light receiving means for receiving light transmitted through the electro-optical devices. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005257479(A) 申请公布日期 2005.09.22
申请号 JP20040069743 申请日期 2004.03.11
申请人 SEIKO EPSON CORP 发明人 HANIYUDA CHIHARU
分类号 G01N21/958;G01M11/00;G02F1/13;G09F9/00;(IPC1-7):G01M11/00 主分类号 G01N21/958
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