发明名称 SCANNING SYSTEMS AND METHODS WITH TIME DELAY SENSING
摘要 Methods and systems that excite a test structure with an excitation beam and then sense the response of the test structure after some prescribed time interval with respect to the excitation. One or more detectors detect an emission from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam as the beam is scanned across the test structure.
申请公布号 US2005205779(A1) 申请公布日期 2005.09.22
申请号 US20050907081 申请日期 2005.03.18
申请人 OPTOMETRIX, INC. 发明人 FALK ROBERT A.
分类号 G01N21/17;G01N29/00;G02B21/00;G21K1/06;G21K7/00;(IPC1-7):G01N29/00 主分类号 G01N21/17
代理机构 代理人
主权项
地址