METHOD AND APPARATUS FOR THE TWO-DIMENSIONAL MAPPING OF THE ELECTRO-OPTICAL COEFFICIENT

摘要

The invention concerns a method for measuring and two-dimensional mapping of the electro-optical properties of materials transparent to the electromagnetic radiation, comprising a first step A of reproducing of a substantially coherent and monochromatic electromagnetic beam, a subsequent step B of projection of the beam onto the transparent material to be analysed which is subjected to an electrical field, a subsequent step C of processing of said beam by means of an interferometric system (5) and a subsequent step D of detection of the beam exiting from said interferometric system characterised in that the projection of step B is realised in such a way that the beam is enlarged as far as to have a two-dimensional cross section comparable with the realised by means of device (7) suited to two-dimensionally detect the beam exiting from the interferometric system (5). The invention also concerns a cell to be utilised in the method according to the invention for applying an electrical field to the material, the cell using liquid electrodes, and an apparatus implementing such method.