发明名称 SEMICONDUCTOR DEVICE, DRAM INTEGRATED CIRCUIT DEVICE, AND ITS MANUFACTURING METHOD
摘要 <p>A semiconductor device with a multi-layer wiring structure includes a first conductive region: a second conductive region that has an upper surface located in a higher position than the first conductive region with respect to the substrate; an insulating that covers the first and second conductive regions; a wiring groove that is formed in the insulating film so as to expose the second conductive region; a contact hole that is formed in the insulating film so as to expose the first conductive region; and a wiring pattern that fills the wiring groove and the contact hole. In this semiconductor device, the upper surface of the wiring pattern is located on the same plane as the upper surface of the insulating film.</p>
申请公布号 EP1577938(A1) 申请公布日期 2005.09.21
申请号 EP20030768265 申请日期 2003.12.25
申请人 FUJITSU LIMITED 发明人 EMA, TAIJI
分类号 H01L21/768;H01L21/8242;H01L23/522;H01L27/108;(IPC1-7):H01L21/768;H01L21/824 主分类号 H01L21/768
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