发明名称 |
Polishing head of chemical mechanical polishing apparatus and polishing method using the same |
摘要 |
A chemical mechanical polishing (CMP) apparatus includes a polishing head that is composed of a carrier and a membrane, and is positioned on a polishing pad of a supporting part. The polishing head has a supporter installed at an internal center of the carrier, a chucking ring positioned between the carrier and the supporter, and means for moving the chucking ring up and down in a vertical direction. The supporter forms a sealed space together with the membrane, and the chucking ring chucks the wafer in vacuum.
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申请公布号 |
US6945861(B2) |
申请公布日期 |
2005.09.20 |
申请号 |
US20050075635 |
申请日期 |
2005.03.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BOO JAE-PHIL;KIM JONG-SOO;RYU JUN-GYU;LEE SANG-SEON;LEE SUN-WUNG |
分类号 |
B24B41/06;(IPC1-7):B24B49/00 |
主分类号 |
B24B41/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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