发明名称 Polishing head of chemical mechanical polishing apparatus and polishing method using the same
摘要 A chemical mechanical polishing (CMP) apparatus includes a polishing head that is composed of a carrier and a membrane, and is positioned on a polishing pad of a supporting part. The polishing head has a supporter installed at an internal center of the carrier, a chucking ring positioned between the carrier and the supporter, and means for moving the chucking ring up and down in a vertical direction. The supporter forms a sealed space together with the membrane, and the chucking ring chucks the wafer in vacuum.
申请公布号 US6945861(B2) 申请公布日期 2005.09.20
申请号 US20050075635 申请日期 2005.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BOO JAE-PHIL;KIM JONG-SOO;RYU JUN-GYU;LEE SANG-SEON;LEE SUN-WUNG
分类号 B24B41/06;(IPC1-7):B24B49/00 主分类号 B24B41/06
代理机构 代理人
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