发明名称 Process for making air gap containing semiconducting devices and resulting semiconducting device
摘要 A method of forming at least a partial air gap within a semiconducting device and the resulting devices, said method comprising the steps of: (a) depositing a sacrificial polymeric composition in one or more layers of the device during its formation; (b) coating the device with one or more layers of a relatively non-porous, organic, polymeric, insulating dielectric material (hardmask) having a density less than 2.2 g/cm<SUP>3</SUP>; and (c) decomposing the sacrificial polymeric composition such that the decomposition products permeate at least partially through the one or more hardmask layers, thereby forming at least a partial air gap within the device.
申请公布号 US6946382(B2) 申请公布日期 2005.09.20
申请号 US20040505511 申请日期 2004.08.24
申请人 DOW GLOBAL TECHNOLOGIES INC. 发明人 TOWNSEND, III PAUL H.;FOSTER KENNETH L.
分类号 H01L23/522;H01L21/027;H01L21/311;H01L21/312;H01L21/316;H01L21/762;H01L21/768;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L23/522
代理机构 代理人
主权项
地址