发明名称 METHOD FOR ANALYZING CHARGED PARTICLES IN HYPERBOLOID MASS SPECTROMETER OF THREE-DIMENSIONAL ION TRAP TYPE
摘要 FIELD: hyperboloid mass spectrometry; producing high resolution and mass spectrum speed devices. ^ SUBSTANCE: proposed method for analyzing charged particles in hyperboloid mass spectrometry of three-dimensional ion trap type includes measurement of electric field parameters (mass spectrum sweep) started simultaneously with input of ions in trap space and completion of ion input as soon as working point of ion corresponding to one of boundaries of mass operating range reaches boundary of stability zone whose use discharges ions from trap. ^ EFFECT: reduced analyzing time, improved analytical characteristics of device. ^ 1 cl, 2 dwg
申请公布号 RU2260871(C2) 申请公布日期 2005.09.20
申请号 RU20010120142 申请日期 2001.07.18
申请人 发明人 SHERETOV EH.P.;IVANOV V.V.;KARNAV T.B.;FILIPPOV I.V.
分类号 H01J49/42 主分类号 H01J49/42
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