发明名称 High holding voltage ESD protection structure and method
摘要 The holding voltage (the minimum voltage required for operation) of a LVTSCR-like device is increased to a value that is greater than a dc bias on a to-be-protected node. The holding voltage is increased by reducing the size of the p+ emitter defined by the LVTSCR-like device. As a result, the LVTSCR can be utilized to provide ESD protection to power supply pins, having better current capabilities than a GGNMOS and better holding voltage characteristics than a LVTSCR.
申请公布号 US6946690(B1) 申请公布日期 2005.09.20
申请号 US20010816287 申请日期 2001.03.21
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 VASHCHENKO VLADISLAV;CONCANNON ANN;HOPPER PETER J.
分类号 H01L27/02;H01L29/74;(IPC1-7):H01L29/74 主分类号 H01L27/02
代理机构 代理人
主权项
地址