发明名称 ANALYZING METHOD AND ITS DEVICE FOR IMPURITY IN MIXED GAS
摘要 PROBLEM TO BE SOLVED: To provide an analyzing method and its device for impurity in mixed gas, to highly accurately and continuously measure impurity components included in a mixed gas of a relatively large amount of oxygen with a rare gas, the oxygen having ionization potential lower than that of an impurity component being a measuring object. SOLUTION: The mixed gas mainly composed of the rare gas and oxygen is introduced at a pressure lower than the atmospheric pressure into a discharge tube 12 with its electrode impressed with an AC voltage. Light specific to an impurity included in the mixed gas is extracted from light generated by electric discharge in the discharge tube to detect its light emission intensity, while measuring rare gas concentration in the mixed gas or oxygen concentration. The detected emission intensity is corrected correspondent to the measured rare gas concentration or oxygen concentration to calculate impurity concentration. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005249551(A) 申请公布日期 2005.09.15
申请号 JP20040059504 申请日期 2004.03.03
申请人 TAIYO NIPPON SANSO CORP 发明人 BABA CHOKUHO;GO NAONORI
分类号 G01N21/67;(IPC1-7):G01N21/67 主分类号 G01N21/67
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