| 摘要 |
In one embodiment, a method of examining an object is disclosed comprising scanning an object at first and second radiation energies, detecting radiation at the first and second energies, and calculating a function of the radiation detected at the first and second energies. The function may be calculated for corresponding portions of the object. It is determined whether the object at least potentially comprises high atomic number material having an atomic number greater than a predetermined atomic number based, at least in part, on the function. The function may be a ratio. The function may be compared to a second function, which may be a threshold having a value based, at least in part, on material of the predetermined atomic number. The second function may be the same as the first function. |
