发明名称 Process and system for laser crystallization processing of film regions on a substrate to provide substantial uniformity, and a structure of such film regions
摘要 A process and system for processing a thin film sample (e.g., a semiconductor thin film), as well as the thin film structure are provided. In particular, a beam generator can be controlled to emit at least one beam pulse. With this beam pulse, at least one portion of the film sample is irradiated with sufficient intensity to fully melt such section of the sample throughout its thickness, and the beam pulse having a predetermined shape. This portion of the film sample is allowed to resolidify, and the re-solidified at least one portion is composed of a first area and a second area. Upon the re-solidification thereof, the first area includes large grains, and the second area has a region formed through nucleation. The first area surrounds the second area and has a grain structure which is different from a grain structure of the second area. The second area is configured to facilitate thereon an active region of an electronic device.
申请公布号 US2005202654(A1) 申请公布日期 2005.09.15
申请号 US20050525288 申请日期 2005.02.16
申请人 IM JAMES S. 发明人 IM JAMES S.
分类号 C30B35/00;H01L21/20;H01L21/336;H01L21/428;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/428 主分类号 C30B35/00
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