| 摘要 |
Method for the memory self-test of embedded memories ( 2, 3, 4 ) in semiconductor chips ( 1 ), a memory address range ( 8 ) being assigned to a memory ( 2 ) to be tested and addresses from the same memory address range of the memory to be tested being allocated to at least one memory self-test controller register ( 6 R 2 ) of a memory self-test controller for storing memory test configuration data.
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