发明名称 SEMICONDUCTOR ELEMENT AND SEMICONDUCTOR ELEMENT MANUFACTURING METHOD
摘要 <p>[PROBLEMS] To provide a semiconductor element having a novel penetrating electrode structure which maintains sufficient yield, suppresses cost increase and maintains reliability and a manufacturing method thereof. [MEANS FOR SOLVING PROBLEMS] The penetrating electrodes (31, 32, 33) and a semiconductor substrate (1) are made of a same material, and the penetrating electrodes (31, 32, 33) have a structure wherein electrical insulation between the penetrating electrodes and the semiconductor substrate can be obtained by PN junction, without an insulating film, by forming an opposite type diffusion layer to the semiconductor substrate. Therefore, insulating film formation is not required, cost can be reduced and a reliability can be improved.</p>
申请公布号 WO2005086216(A1) 申请公布日期 2005.09.15
申请号 WO2005JP04124 申请日期 2005.03.09
申请人 JAPAN SCIENCE AND TECHNOLOGY AGENCY;KAWAMOTO, HIROSHI 发明人 KAWAMOTO, HIROSHI
分类号 H01L21/3205;H01L23/32;H01L25/04;H01L25/065;H01L25/07;H01L25/18;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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