发明名称 Semiconductor device and method of manufacturing same
摘要 The present invention provides a semiconductor device formed with a diode array together with bipolar transistors, which is capable of preventing the occurrence of crystal defects developed in cross patterns in deep trench regions and improving device yields, and a method of manufacturing the semiconductor device. A semiconductor device includes a LOCOS oxide film which isolates a plurality of diodes in an X direction, and deep trenches which isolate the plurality of diodes in a Y direction. The depth of each of the deep trenches is deeper than a high density layer embedded below a collector layer of each bipolar transistor. A shallow trench may be used as an alternative to the LOCOS oxide film.
申请公布号 US2005199980(A1) 申请公布日期 2005.09.15
申请号 US20040929475 申请日期 2004.08.31
申请人 FUJIMAKI HIROKAZU 发明人 FUJIMAKI HIROKAZU
分类号 H01L21/76;H01L21/8222;H01L27/06;H01L27/102;H01L29/861;(IPC1-7):H01L21/76 主分类号 H01L21/76
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