发明名称 Method and system for detecting defects
摘要 System for scanning a surface, including a light source producing an illuminating light beam; an objective lens assembly, located between the light source and the surface; at least one light detector; an apodizator located between the light source and the objective lens assembly; and a relay lens assembly located between the apodizator and the objective lens assembly, wherein the light source produces an image of the illuminating light beam on the apodizator, the apodizator blocks at least a portion of the illuminating light beam, the relay lens assembly images the blocked illuminating light beam at an entrance pupil of the objective lens assembly, and wherein at least one of said at least one light detector, detects light reflected from said surface.
申请公布号 US2005200839(A1) 申请公布日期 2005.09.15
申请号 US20050066879 申请日期 2005.02.25
申请人 APPLIED MATERIALS, INC. 发明人 GOLDBERG BORIS;NAFTALI RON
分类号 G01N21/95;G01N21/956;G02B21/00;G02B27/58;G03F7/20;H01L21/00;(IPC1-7):G01N21/00;G01B11/00 主分类号 G01N21/95
代理机构 代理人
主权项
地址