发明名称 THERMOPHYSICAL PROPERTY MEASURING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To measure simultaneously physical properties such as a specific heat capacity, a hemispherical total emissivity, a thermal conductivity and a thermal diffusibility, when measuring the physical properties of a high-temperature material. SOLUTION: A power accumulated in a high-capacity capacitor 2 is supplied to a conductive sample 5 through a standard resistance 4 by switching a current switch 3 using a field effect transistor to the ON state, to thereby raise the sample temperature to a high temperature in a short time. The surface temperature of the sample 5 at that time is measured by a radiation thermometer 7, and a control device 12 adjusts operation of the current switch 3 so that the temperature becomes a prescribed temperature and controls the magnitude of a current flowing in the sample 5. The back of the sample 5 is irradiated with pulsed light from a pulse YAG laser 6 in a heating period at the prescribed temperature, and the thermal diffusibilty of the sample 5 is measured from the change of the surface temperature. The thermal conductivity is calculated from the values of the measured thermal diffusibilty and the volume heat capacity of the sample determined by measuring the power supplied to the sample at the electric heating time and the change of the sample temperature and the density measured separately. The hemispherical total emissivity is measured simultaneously. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005249427(A) 申请公布日期 2005.09.15
申请号 JP20040056747 申请日期 2004.03.01
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 WATANABE HIROMICHI;BABA TETSUYA
分类号 G01N25/18;(IPC1-7):G01N25/18 主分类号 G01N25/18
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