发明名称 LARGE PANEL STRUCTURE FOR ELECTROOPTICAL DEVICE, ELECTROOPTICAL DEVICE, SUBSTRATE FOR ELECTROOPTICAL DEVICE, METHOD FOR MANUFACTURING ELECTROOPTICAL DEVICE, AND METHOD FOR INSPECTING ELECTROOPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To efficiently carry out a display inspection during manufacturing process of a liquid crystal display device. SOLUTION: On the end edge of a first large substrate 110 having a plurality of TFT substrate areas 10, a test terminal 111 to be connected, via a wiring pattern, to an external connection terminal 102 formed on each TFT substrate area 10 is formed. When a large panel structure 150 is formed by sticking the large substrates 110 and 120, a second large substrate 120 is biased with respect to the first large substrate 110 so that the test terminal 111 is exposed on a probing area 121 formed on one end face of the second large substrate 120. Then, a terminal of an inspection probe is made to contact the test terminal 111, and the display inspection is carried out en bloc in the state of the large panel structure 150 as it is. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005249939(A) 申请公布日期 2005.09.15
申请号 JP20040057588 申请日期 2004.03.02
申请人 SEIKO EPSON CORP 发明人 ISHII TAIJI;KITAHARA HIDEKI;SAITO MASAO
分类号 G02F1/13;G02F1/1345;G02F1/1368;G09F9/00;(IPC1-7):G09F9/00;G02F1/136;G02F1/134 主分类号 G02F1/13
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