发明名称 Surface acoustic wave device
摘要 A surface acoustic wave device includes a ZnO dielectric thin film on a quartz substrate and an IDT electrode having strips between the ZnO thin film and the quartz substrate. The IDT electrode has at least one region where the strips are disposed at an interval defined by approximately a half-wavelength of the surface acoustic wave. The duty ratio of the IDT electrode is preferably more than about 0.5. Alternatively, a protrusion is formed via a slope in the region of the ZnO thin film where the IDT electrode is disposed, and the inclination angle theta of the slope is more than about 30°.
申请公布号 US2005200233(A1) 申请公布日期 2005.09.15
申请号 US20050118512 申请日期 2005.04.29
申请人 MURATA MANUFACTURING CO., LTD. 发明人 KANDO HAJIME
分类号 H03H9/02;H03H9/145;(IPC1-7):H03H9/00;H02N2/00 主分类号 H03H9/02
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