摘要 |
<p>A method (300) for trimming resistors (422), and an apparatus (400) for trimming resistors are provided for resistors made of a material whose resistance changes in response to applied voltage. The method comprises measuring (310) the resistance of the resistor. The measured resistance is compared (320) with a target resistance. Based. on the difference (330) between the measured resistance and the target resistance, trimming (340) control parameters (maximum sweep voltage, sweep rate, pulse voltage level, pulse duration, pulse shape) of the applied voltage are calculated. An electric power corresponding to the calculated trimming control parameters is applied across the resistor so as to cause the resistor's resistance to approach the target resistance. The resistor's resistance is measured again and compared with the target resistance. If the difference is not sufficiently small, process described above is repeated until the difference between the measured resistance and the target resistance is less than a pre-specified value.</p> |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;CHEN, FEN;CHRISTIANSEN, CATHRYN, J.;DUFRESNE, ROGER, A.;LEE, TOM, C.;LI, BAOZHEN;STRONG, ALVIN, W.;WATSON, KIMBALL, M.;WYNNE, JEAN, E. |
发明人 |
CHEN, FEN;CHRISTIANSEN, CATHRYN, J.;DUFRESNE, ROGER, A.;LEE, TOM, C.;LI, BAOZHEN;STRONG, ALVIN, W.;WATSON, KIMBALL, M.;WYNNE, JEAN, E. |