发明名称 CLEANING AGENT COMPOSITION, CLEANING AND PRODUCTION METHODS FOR SEMICONDUCTOR WAFER
摘要 A cleaning agent composition comprising a nonionic surfactant represented by the following formula (1): R1O(EO)x(PO)yH (I)(wherein R1 represents a linear or branched alkyl group having from 6 to 20 carbon atoms or a linear or branched alkenyl group having from 6 to 20 carbon atoms, EO represents an oxyethylene group, PO represents an oxypropylene group, EO and PO each is bonded by random addition or block addition, x number of EOs and y number of POs are arranged in an arbitrary order, x and y each independently represents an integer of 1 to 20, and x/(x+y) is 0.5 or more) and a quaternary ammonium hydroxide) is provided. Also, cleaning and production methods for semiconductor wafer using the cleaning agent composition and semiconductor wafer produced by the production method are provided.
申请公布号 EP1572856(A1) 申请公布日期 2005.09.14
申请号 EP20030778777 申请日期 2003.12.10
申请人 SHOWA DENKO K.K. 发明人 AMEMIYA, MASAHIRO;TANAKA, YOSHIO
分类号 C11D1/722;C11D3/26;C11D3/30;C11D3/39;C11D11/00;C11D17/00;H01L21/302;H01L21/304;H01L21/306 主分类号 C11D1/722
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