发明名称 Position measuring system
摘要 A position measuring system that includes a scale having an incremental graduation track of a defined incremental graduation period and on at least one defined reference position, a reference marking field with a mean reference marking graduation period. A scanning unit movable with respect to the scale, the scanning unit having a plurality of scanning elements for generating scanning signals, wherein at least two phase-shifted incremental signals are generated as scanning signals. A first evaluation device that determines a rough reference position. A second evaluation device that determines a beat signal phase. A third evaluation device, which is suitable for unequivocally marking a beat signal period from the rough reference position and, if a defined phase position exists, to issue a fine reference position from the beat signal phase.
申请公布号 US6943341(B2) 申请公布日期 2005.09.13
申请号 US20040768986 申请日期 2004.01.30
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 HUBER WALTER;LINNEMANN UDO;HOLZAPFEL WOLFGANG
分类号 G01D5/36;G01D5/38;(IPC1-7):G01D5/34 主分类号 G01D5/36
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