发明名称 |
Method for selection of optical fiber and system for inspection of optical fiber |
摘要 |
An optical fiber inspecting system 1 A comprises a waveform measuring unit 2 for measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unit 3 for evaluating an anomaly within the optical fiber. The waveform evaluating unit 3 comprises a calculating part 4 and a detecting part 5. The calculating part 4 calculates the gradient and the amount of change in gradient of the waveform at each time point. The detecting part 5 determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.
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申请公布号 |
US6943872(B2) |
申请公布日期 |
2005.09.13 |
申请号 |
US20030395858 |
申请日期 |
2003.03.25 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
ENDO SHINJI;NAGAO YOSHIAKI;YAMAMOTO TOSHIYUKI;OSHIMA TOSHIO |
分类号 |
G01M11/00;G01N21/00;(IPC1-7):G01N21/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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