发明名称 Method for selection of optical fiber and system for inspection of optical fiber
摘要 An optical fiber inspecting system 1 A comprises a waveform measuring unit 2 for measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unit 3 for evaluating an anomaly within the optical fiber. The waveform evaluating unit 3 comprises a calculating part 4 and a detecting part 5. The calculating part 4 calculates the gradient and the amount of change in gradient of the waveform at each time point. The detecting part 5 determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.
申请公布号 US6943872(B2) 申请公布日期 2005.09.13
申请号 US20030395858 申请日期 2003.03.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 ENDO SHINJI;NAGAO YOSHIAKI;YAMAMOTO TOSHIYUKI;OSHIMA TOSHIO
分类号 G01M11/00;G01N21/00;(IPC1-7):G01N21/00 主分类号 G01M11/00
代理机构 代理人
主权项
地址