发明名称 Two-sided chemical mechanical polishing pad for semiconductor processing
摘要 A chemical mechanical polishing (CMP) pad includes a unitary body having a first side and a second side, the first side having a plurality of holes formed therein, and the second side having a plurality of grooves formed therein. Each of the plurality of holes in the first side is aligned with one of the plurality of grooves in the second side.
申请公布号 US6942549(B2) 申请公布日期 2005.09.13
申请号 US20030605828 申请日期 2003.10.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KHOURY RAYMOND M.
分类号 B24B37/04;B24D13/14;(IPC1-7):B24B1/00;B24D11/00 主分类号 B24B37/04
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