发明名称 Method for the quality control of material layers
摘要 Disclosed is a method for quality control of a material layer, which involves providing the material of the layer with an agent for absorbing an electromagnetic radiation, irradiating the surface of the layer with an electromagnetic radiation, and measuring the amount of light emitted by the material layer, for example, reflected radiation or fluorescence radiation.
申请公布号 US6943902(B2) 申请公布日期 2005.09.13
申请号 US20020148992 申请日期 2002.06.06
申请人 INSTITUT FUER CHEMO-UND BIOSENSORIK MUENSTER E.V. 发明人 BORCHARDT MICHAEL;WENDZINSKI FRANK;EIKERMANN DORTHE
分类号 G01B11/06;G01B11/30;G01N21/88;G01N21/91;(IPC1-7):G01B11/06 主分类号 G01B11/06
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