发明名称 PRODUCTION METHOD FOR SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 <p>The oxide film (2) of a sensor element (11) is formed on a rectangular substrate (1), a diaphragm (3) is formed on the oxide film (2), fixing units (4) are formed on the diaphragm (3), a back electrode (5) is formed on the fixing units (4) so as to face the substrate (1), a gap area (6) is formed between the substrate (1) and the back electrode (5) by the fixing units (4), and a rectangular jetting (12) is formed to be positioned between the sensor element (11) and the sides so as to surround the back electrode (5) formed on the fixing units (4). The jetting (12) can prevent foreign matters (104) produced at dicing from intruding into the semiconductor element (11).</p>
申请公布号 WO2005083764(A1) 申请公布日期 2005.09.09
申请号 WO2005JP03301 申请日期 2005.02.28
申请人 TOKYO ELECTRON LIMITED;HOSIDEN CORPORATION;KAGAWA, KENICHI;YAKABE, MASAMI;SAEKI, SHINICHI;OHTSUJI, TAKAHISA 发明人 KAGAWA, KENICHI;YAKABE, MASAMI;SAEKI, SHINICHI;OHTSUJI, TAKAHISA
分类号 H01L29/84;B81C1/00;G01D5/24;H01L21/301;H04R19/04;H04R31/00;(IPC1-7):H01L21/301 主分类号 H01L29/84
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